FEATURES
- Enables users to access Active Measurement 1 and 2, individual beam states, or all measurement modes as process data.
- IO-Link 1.1 reads parameter data 8x faster than version 1.0.
- Features closely spaced infrared beams that detect objects as small as 5mm.
- Offers automatic device replacement for quick device configuration—simply plug in an EZ-Array to the IO-Link master and the configuration will be automatically loaded onto it.
- Applications include edge and center-guiding, loop-tension control, hole sizing, parts counting, and on-the-fly product sizing and profiling.
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